• DocumentCode
    2890618
  • Title

    Analysis, design and application of a capacitance measurement circuit with wide operating frequency range

  • Author

    Deabes, W.A. ; Abdelrahman, M.A. ; Murray, Conrad

  • Author_Institution
    Electr. & Comput. Eng. Dept., Tennessee Tech Univ., Cookeville, TN
  • fYear
    2008
  • fDate
    3-5 Sept. 2008
  • Firstpage
    114
  • Lastpage
    119
  • Abstract
    A novel high frequency, low cost circuit for measuring capacitance is proposed in this paper. This new capacitance measuring circuit is able to measure small coupling capacitance variations with high stray-immunity. Hence, it could be used in many potential applications such as measuring a metal fill time in the lost foam casting (LFC) process and electrical capacitive tomography (ECT) system. The proposed circuit is based on differential charging/discharging method using current feedback amplifier and a synchronous demodulation stage. The circuit has a wide high frequency operating range with zero phase shift; hence multiple circuits can work at different frequencies simultaneously to measure the capacitance. The non-ideal characteristics of the circuit has been analyzed and verified through LTSpice simulation. Results from the tests on a prototype and a simulation elucidate the practicality of the proposed circuit.
  • Keywords
    capacitance measurement; demodulation; feedback amplifiers; LTSpice simulation; capacitance measurement circuit; current feedback amplifier; differential charging-discharging method; electrical capacitive tomography system; lost foam casting process; metal fill time measurement; small coupling capacitance variations; stray-immunity; synchronous demodulation stage; Capacitance measurement; Circuit simulation; Circuit testing; Costs; Coupling circuits; Electric variables measurement; Electrical capacitance tomography; Frequency measurement; Loss measurement; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control Applications, 2008. CCA 2008. IEEE International Conference on
  • Conference_Location
    San Antonio, TX
  • Print_ISBN
    978-1-4244-2222-7
  • Electronic_ISBN
    978-1-4244-2223-4
  • Type

    conf

  • DOI
    10.1109/CCA.2008.4629613
  • Filename
    4629613