Title :
An application of quantized trapped flux in a superconducting memory
Author :
Dumin, D. ; Gibbons, J.
Author_Institution :
Stanford University, Stanford, CA, USA
Keywords :
Critical current; Detectors; Gaussian processes; Geometry; Insulation; Magnetic field measurement; Quantization; Quantum mechanics; Superconductivity; Tin;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1963 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1963.1157458
