• DocumentCode
    2895861
  • Title

    Gate noise in silicon field-effect transistors

  • Author

    Blair, L. ; Adler, Rasmus

  • Author_Institution
    Analytic Services, Inc., Bailey´´s Crossroads, VA, USA
  • Volume
    VII
  • fYear
    1964
  • fDate
    19-21 Feb. 1964
  • Firstpage
    44
  • Lastpage
    45
  • Keywords
    Circuit noise; FETs; Frequency; Low-frequency noise; Noise figure; Noise generators; Noise measurement; Semiconductor device noise; Signal to noise ratio; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1964 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1964.1157534
  • Filename
    1157534
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2895861