• DocumentCode
    2897202
  • Title

    Testing digital integrated circuits

  • Volume
    VIII
  • fYear
    1965
  • fDate
    17-19 Feb. 1965
  • Firstpage
    76
  • Lastpage
    76
  • Abstract
    Lists the informal discussion sessions held at the conference proceedings.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1965 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1965.1157608
  • Filename
    1157608
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2897202