• DocumentCode
    2897404
  • Title

    Coverage of a microarchitecture-level fault check regimen in a superscalar processor

  • Author

    Reddy, Virnal ; Rotenberg, Eric

  • Author_Institution
    Qualcomm Inc., San Diego, CA
  • fYear
    2008
  • fDate
    24-27 June 2008
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Conventional processor fault tolerance based on time/space redundancy is robust but prohibitively expensive for commodity processors. This paper explores an unconventional approach to designing a cost-effective fault-tolerant superscalar processor. The idea is to engage a regimen of microarchitecture-level fault checks. A few simple microarchitecture-level fault checks can detect many arbitrary faults in large units, by observing microarchitecture-level behavior and anomalies in this behavior. Previously, we separately proposed checks for the fetch and decode stages, rename stage, and issue stage of a contemporary superscalar processor. While each piece hinted at the possibility of a complete regimen - for an overall fault-tolerant superscalar processor - this totality was not explored. This paper provides the culmination by building a full regimen into a superscalar processor. We show for the first time that the regimen-based approach provides substantial coverage of an entire superscalar processor. Analysis reveals vulnerable areas which should be the focus for regimen additions.
  • Keywords
    fault tolerant computing; microcomputers; fault-tolerant superscalar processor; microarchitecture-level fault check regimen; processor fault tolerance; Analytical models; Decoding; Electrical capacitance tomography; Fault detection; Fault tolerance; Fault tolerant systems; Microarchitecture; Pipelines; Redundancy; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems and Networks With FTCS and DCC, 2008. DSN 2008. IEEE International Conference on
  • Conference_Location
    Anchorage, AK
  • Print_ISBN
    978-1-4244-2397-2
  • Electronic_ISBN
    978-1-4244-2398-9
  • Type

    conf

  • DOI
    10.1109/DSN.2008.4630065
  • Filename
    4630065