DocumentCode

2897462

Title

Aluminum alloy junction backward diodes in microwave detection systems

Author

Wright, Ryan ; Goldman, R.

Author_Institution

Philco Corp., Lansdale, CA, USA

Volume

VIII

fYear

1965

fDate

17-19 Feb. 1965

Firstpage

100

Lastpage

101

Keywords

Aluminum alloys; Capacitance; Detectors; Diodes; Etching; Frequency; Monitoring; Noise figure; Sequential analysis; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1965 IEEE International

Conference_Location

Philadelphia, PA, USA

Type

conf

DOI

10.1109/ISSCC.1965.1157624

Filename

1157624