DocumentCode
2897682
Title
Why focus on building-in reliability
Author
Vasquez, Barbara
Author_Institution
Motorola
fYear
1992
fDate
25-28 Oct. 1992
Firstpage
38
Lastpage
43
Keywords
Assembly; Costs; Food manufacturing; Integrated circuit testing; Materials reliability; Packaging; Product development; Qualifications; Research and development; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Wafer Level Reliability Workshop, 1992. Final Report., 1992 International
Conference_Location
Lake Tahoe, CA, USA
Type
conf
DOI
10.1109/IWLR.1992.657982
Filename
657982
Link To Document