• DocumentCode
    2899599
  • Title

    Influence of ion effects on a space charge limited field emission flow: From non-relativistic to ultra-relativistic regimes

  • Author

    Lin, M.C. ; Lu, P.S. ; Chang, P.C. ; Verboncoeur, J.P.

  • Author_Institution
    NSSL, Fu Jen Catholic Univ., Taipei, Taiwan
  • fYear
    2012
  • fDate
    24-26 April 2012
  • Firstpage
    365
  • Lastpage
    366
  • Abstract
    Influence of ion effects on a space charge limited field emission flow has been studied systematically, by employing both analytical and numerical approaches. The analytic calculations are carried out self-consistently to yield the steady states of the bipolar flow. It is found that the field emission currents in the presence of saturated ion currents can be enhanced to be nearly 1.8, 1.5, and 1.4 times of the cases with no upstream ion current in non-relativistic, intermediate, and ultra-relativistic regimes, respectively. The solutions have also been verified using 1D PIC simulations, as implemented in the OOPD1 code developed by PTSG of UC Berkeley.
  • Keywords
    electron field emission; space charge; 1D PIC simulations; OOPD1 code; bipolar flow; field emission currents; ion effects; nonrelativistic regime; saturated ion currents; space charge limited field emission flow; steady states; ultra-relativistic regime; upstream ion current; Anodes; Cathodes; Equations; Mathematical model; Poisson equations; Schottky diodes; Space charge; Fowler-Nordheim; OOPD1; Space charge limited field emission; ion effects; relativistic; self-consistent;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2012 IEEE Thirteenth International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4673-0188-6
  • Electronic_ISBN
    978-1-4673-0187-9
  • Type

    conf

  • DOI
    10.1109/IVEC.2012.6262197
  • Filename
    6262197