Title :
Response of electrohydrodynamic convection to external noise
Author :
Huh, Jong-Hoon ; Cui, Xiangwen
Author_Institution :
Dept. of Mech. Inf. Sci. & Technol., Kyushu Inst. of Technol., Fukuoka, Japan
Abstract :
We report noise-induced threshold shifts in ac-driven electrohydrodynamic convection (EHC) in nematic liquid crystals. By changing the intensity VN and cutoff frequency fc of noise, we investigate EHC-threshold shifts. There exists the characteristic cutoff frequency fc* for the influence of noise on EHC. For cutoff frequencies fc >; fc*, noise contributes to stabilizing the onset of EHC (i.e., it shifts the onset threshold upward), whereas for fc <; fc*, noise contributes to destabilizing the onset of EHC (i.e., it shifts the onset threshold downward). For fc = fc*, noise makes no contribution to the threshold shift (i.e., it is neutral with respect to the onset of EHC). However, the pattern structure of EHC is changed by VN, independent of fc.
Keywords :
convection; electrohydrodynamics; nematic liquid crystals; pattern formation; ac-driven electrohydrodynamic convection; cutoff frequency; external noise effect; nematic liquid crystals; noise-induced threshold shifts; pattern structure; Cutoff frequency; Sensitivity; electrohydrodynamic convection; nematic liquid crystals; noise;
Conference_Titel :
Noise and Fluctuations (ICNF), 2011 21st International Conference on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4577-0189-4
DOI :
10.1109/ICNF.2011.5994316