• DocumentCode
    2900463
  • Title

    Development of high voltage pulser for High Power Electromagnetic (HPEM) simulation

  • Author

    Bhosale, Vijay H. ; Pande, D.C.

  • Author_Institution
    Electron. & Radar Dev. Establ., Bangalore, India
  • fYear
    2011
  • fDate
    21-24 Feb. 2011
  • Firstpage
    51
  • Lastpage
    52
  • Abstract
    In the present scenario, the pulse power technology plays a vital role in variety of applications ranging from industrial & medical fields to scientific & defence applications. One of the defensive applications is in the hardness assurance testing of the hardened mission critical defence electronics. Sophisticated mission critical defence electronics is highly susceptible to the transient Electromagnetic Environment (EME) of high intensity. Hence sufficient protection needs to be given to such critical defence electronics to withstand against the damaging & upsetting effects of High Power Electro Magnetics (HPEM). In order to validate the degree of protection provided, the hardened system(s) needs to be exposed to the simulated transient environment. This requires the development of a high voltage pulser with a very peculiar wave shape of the output impulse voltage. The challenges faced in realization & development of a typical 640 kV High Voltage pulser for one of the HPEM environment simulators are discussed in this paper.
  • Keywords
    electromagnetic pulse; high-voltage engineering; pulsed power supplies; HPEM simulation; defensive application; hardened mission critical defence electronics; hardness assurance testing; high power electromagnetic simulation; high voltage pulser; impulse voltage; pulsed power technology; sophisticated mission critical defence electronics; transient electromagnetic environment; voltage 640 kV; Capacitors; Geometry; Inductance; Optical switches; Switching circuits; Transient analysis; EM; EME; HPEM; NEMP;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2011 IEEE International
  • Conference_Location
    Bangalore
  • Print_ISBN
    978-1-4244-8662-5
  • Type

    conf

  • DOI
    10.1109/IVEC.2011.5746870
  • Filename
    5746870