DocumentCode
2900901
Title
Qualified manufacturer´s list (QML)-a new approach for qualifying ASICs
Author
Messenger, Charles G.
Author_Institution
Rome Air Dev. Center, Griffiss AFB, NY, USA
fYear
1990
fDate
17-21 Sep 1990
Abstract
The task of device qualification becomes more arduous when the process is applied to application-specific integrated circuits (ASICs) where quick turn-around and low volumes are involved. These problems have been addressed by developing a process oriented system where the disciplines of design, fabrication, assembly, and test for a given technology are certified and qualified instead to individual devices. This approach, defined in MIL-I-38535 General Specifications for Integrated Circuits Manufacturing, is an outgrowth of the RADC Generic Qualification Program. Manufacturers who successfully complete the requirements will be listed on a qualified manufacturer´s listing (QML) and all products built and tested on the QML flow will be qualified for use in military systems. The QML requirements address all types of integrated circuits. Issues of certifying testability/fault coverage capabilities, cell libraries, design and electrical rules, and design flow procedures are detailed. The concept is being expanded to encompass linear design, space-critical, and radiation-hardened requirements and GaAs fabrication, design, and test procedures
Keywords
application specific integrated circuits; integrated circuit manufacture; integrated circuit testing; production testing; quality control; standards; ASIC qualification; MIL-I-38535; QML requirements; RADC Generic Qualification Program; application-specific integrated circuits; assembly; cell libraries; design flow procedures; fabrication; fault coverage capabilities; military systems; process oriented system; qualified manufacturer´s listing; testability; Application specific integrated circuits; Assembly systems; Circuit faults; Circuit testing; Fabrication; Integrated circuit manufacture; Integrated circuit technology; Manufacturing; Qualifications; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC Seminar and Exhibit, 1990. Proceedings., Third Annual IEEE
Conference_Location
Rochester, NY
Type
conf
DOI
10.1109/ASIC.1990.186073
Filename
186073
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