Title :
Advances in fabrication error analysis for a mm-wave ring-bar TWT circuit
Author :
Sengele, Sean ; Barsanti, Marc ; Hargreaves, Tom ; Armstrong, Carter ; Booske, John H. ; Lau, Yue Ying
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin-Madison, Madison, WI, USA
Abstract :
The development and microfabrication of a millimeter-wave ring-bar slow-wave structure is presented. Dimensional measurements and subsequent HFSS analyses were completed to predict the impact of fabrication errors on phase velocity and interaction impedance. The effect of random fabrication errors on the fundamental and backward-wave gain and bandwidth were explored using a modified Pierce analysis which allowed for random variation of the Pierce parameters along the axis of the TWT.
Keywords :
error analysis; microfabrication; millimetre wave tubes; slow wave structures; Pierce analysis; backward-wave gain; dimensional measurements; fabrication error analysis; interaction impedance; microfabrication; millimeter-wave ring-bar slow-wave structure; mm-wave ring-bar TWT circuit; phase velocity; subsequent HFSS analyses; travelling wave tubes; Bandwidth; Electron tubes; Error analysis; Fabrication; Gain; Impedance; Prototypes; Ring-bar; error analysis; mm-wave;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2012 IEEE Thirteenth International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4673-0188-6
Electronic_ISBN :
978-1-4673-0187-9
DOI :
10.1109/IVEC.2012.6262268
