• DocumentCode
    2901282
  • Title

    On the applicability of Two-Ray path loss models for vehicular network simulation

  • Author

    Sommer, Christoph ; Joerer, Stefan ; Dressler, Falko

  • Author_Institution
    Inst. of Comput. Sci., Univ. of Innsbruck, Innsbruck, Austria
  • fYear
    2012
  • fDate
    14-16 Nov. 2012
  • Firstpage
    64
  • Lastpage
    69
  • Abstract
    We discuss the applicability of simplified Two-Ray Ground path loss models to simulation-based performance evaluation studies of Inter-Vehicle Communication (IVC) protocols. We contrast this with the applicability of a more exact Two-Ray Interference model. A key result is that, in most cases, the commonly used simplified Two-Ray Ground models add no additional value compared to the most simple Free-space model - in particular in highway and suburban environments. We further argue that replacing a simplified with a fully featured Two-Ray Interference model can not only substantially improve the accuracy of simulation results but also allow capturing one notable artifact that becomes immediately visible in field tests, namely strong signal attenuation at short and medium ranges. We implemented the Two-ray Interference model within the Veins simulation framework and validated it using analytical predictions and field measurements. We show the impact of the more accurate Two-Ray Interference model, which only comes with negligible additional computational cost for simulation experiments.
  • Keywords
    protocols; radiofrequency interference; road traffic; vehicular ad hoc networks; IVC protocol; computational cost; field measurements; free-space model; intervehicle communication protocol; signal attenuation; two-ray ground path loss model; two-ray interference model; vehicular network simulation; Analytical models; Computational modeling; Interference; Mathematical model; Predictive models; Protocols; Receivers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Networking Conference (VNC), 2012 IEEE
  • Conference_Location
    Seoul
  • ISSN
    2157-9857
  • Print_ISBN
    978-1-4673-4995-6
  • Electronic_ISBN
    2157-9857
  • Type

    conf

  • DOI
    10.1109/VNC.2012.6407446
  • Filename
    6407446