DocumentCode
2901608
Title
The variation of spectral response of transmission-type GaAs photocathode in the seal process
Author
Lei, Liu ; Benkang, Chang ; Du Yujie ; Yunsheng, Qian ; Ping, Gao
Author_Institution
Sch. of Electron. Eng. & Optoelectronic Technol., Nanjing Univ. of Sci. & Technol., China
fYear
2004
fDate
6-10 Sept. 2004
Firstpage
280
Lastpage
282
Abstract
Transmission-type GaAs photocathode are emerging from the laboratory as practical photo-sensing devices with vastly improved sensitivity and spectral range compared with other photocathode. It is widely used in the many fields such as semiconductor device, optical radiation measurement, camera device and low-level-light night vision. Measurement of parameters of photocathode, especially its spectral response, is of great importance on the technique of photocathode´s performance. During the fabrication of photocathode, the technology of online spectral response measurement enables us to determine spectral response quickly and accurately. Through analyzing and comparing those measured response curves, much information about photocathodes, for example, the sensitivity, the photo-electron surface escape probability, the thickness of the active layer, the diffusion length of electrons and the back interface recombination velocity of electrons can be obtained which is useful in both the research and the fabrication of photocathodes (Zhiyuan Zhong and BenKang Chang, 1998; Andre et al, 1981).
Keywords
III-V semiconductors; gallium arsenide; photocathodes; semiconductor device measurement; GaAs; active layer thickness; back interface recombination velocity; detecting distance; diffusion length; online spectral response measurement; photo-electron surface escape probability; photocathode fabrication; seal process; spectral marching factor; transmission-type GaAs photocathode; Cameras; Cathodes; Electrons; Gallium arsenide; Laboratories; Optical devices; Optical sensors; Seals; Semiconductor device measurement; Semiconductor devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electron Sources Conference, 2004. Proceedings. IVESC 2004. The 5th International
Print_ISBN
0-7803-8437-7
Type
conf
DOI
10.1109/IVESC.2004.1414237
Filename
1414237
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