DocumentCode
2901940
Title
Wafer Level joule-heated J-Constant EM Tests
Author
Katto, Hisao
Author_Institution
Device Development Center, Hitachi, Ltd.
fYear
1992
fDate
25-28 Oct. 1992
Firstpage
176
Lastpage
185
Keywords
Current density; Current measurement; Electric breakdown; Equations; Monitoring; Printers; Stress measurement; System testing; Temperature control; Temperature distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Wafer Level Reliability Workshop, 1992. Final Report., 1992 International
Conference_Location
Lake Tahoe, CA, USA
Type
conf
DOI
10.1109/IWLR.1992.658003
Filename
658003
Link To Document