Title :
Performance Analysis of Key Management Schemes in Wireless Sensor Network Using Analytic Hierarchy Process
Author :
Ruan, Na ; Ren, Yizhi ; Hori, Yoshiaki ; Sakurai, Kouichi
Author_Institution :
Dept. of Inf., Kyushu Univ., Fukuoka, Japan
Abstract :
To achieve security in wireless sensor networks (WSNs), key management is one of the most challenging issues in design of WSN due to resource-constrained sensor nodes. Various key management schemes (KMs) have been proposed to enable encryption and authentication in WSN for different application scenarios. According to different requirements, it is important to select the trustworthy KMs in a WSN for setting up a fully appropriate WSN mechanism. An Analytic Hierarchy Process (AHP)-aided method helping with the complex decision has been presented in our previous work. Our purpose in this paper is to do performance analysis of KMs in WSN using our previous AHP-aided method. We analyze the characters of abundance KMs intuitively. The following five performance criteria are considered: scalability, key connectivity, resilience, storage overhead and communication overhead. As all permutations of five performance criteria include 120 types´ situations, experimental analyses on 43 KMs for the optimum selection are presented.
Keywords :
decision making; telecommunication network reliability; telecommunication security; wireless sensor networks; AHP-aided method; WSN; analytic hierarchy process-aided method; authentication; communication overhead; encryption; key connectivity; key management scheme; key management schemes; resilience; resource-constrained sensor node; scalability; storage overhead; wireless sensor network; Linear matrix inequalities; Performance analysis; Proposals; Scalability; Security; Vectors; Wireless sensor networks; Analytic Hierarchy Process; Experimental analysis; Key management schemes; Optimum selection; Wireless sensor network;
Conference_Titel :
Trust, Security and Privacy in Computing and Communications (TrustCom), 2011 IEEE 10th International Conference on
Conference_Location :
Changsha
Print_ISBN :
978-1-4577-2135-9
DOI :
10.1109/TrustCom.2011.243