Title :
Measurement of surface roughness effects on conductivity in the terahertz regime with a high-Q quasioptical resonator
Author :
Yang, Benjamin B. ; Katz, Sarah L. ; Booske, John H.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin-Madison, Madison, WI, USA
Abstract :
A high-Q quasi-optical resonator is used to experimentally measure metal samples with controlled nano-scale textures at 400 GHz and 650 GHz. The results explore the effect of surface roughness on effective conductivity in the terahertz regime.
Keywords :
optical resonators; submillimetre wave measurement; surface roughness; surface topography measurement; effective conductivity; frequency 400 GHz; frequency 650 GHz; high-Q quasioptical resonator; nano-scale textures; surface roughness measurement; terahertz regime; Conductivity; Conductivity measurement; Optical resonators; Q measurement; Resonant frequency; Rough surfaces; Surface roughness; conductivity; resonator; submillimeter waves; surface roughness; terahertz;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2011 IEEE International
Conference_Location :
Bangalore
Print_ISBN :
978-1-4244-8662-5
DOI :
10.1109/IVEC.2011.5747018
