• DocumentCode
    2903345
  • Title

    A Modelling Approach for Coupling Numerical Analytical Techniques Applied in Microsystems

  • Author

    Xue, Xiangdong ; Lu, Hua ; Bailey, Chris

  • Author_Institution
    Univ. of Greenwich, London
  • fYear
    2007
  • fDate
    14-17 Aug. 2007
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    In this paper, a method for the integration of several numerical analytical techniques that are used in microsystems design and failure analysis is presented. The analytical techniques are categorized into four groups in the discussion, namely the high-fidelity analytical tools, i.e. finite element (FE) method, the fast analytical tools referring to reduced order modeling (ROM); the optimization tools, and probability based analytical tools. The characteristics of these four tools are investigated. The interactions between the four tools are discussed and a methodology for the coupling of these four tools is offered. This methodology consists of three stages, namely reduced order modeling, deterministic optimization and probabilistic optimization. Using this methodology, a case study for optimization of a solder joint is conducted. It is shown that these analysis techniques have mutual relationship of interaction and complementation. Synthetic application of these techniques can fully utilize the advantages of these techniques and satisfy various design requirements. The case study shows that the coupling method of different tools provided by this paper is effective and efficient and it is highly relevant in the design and reliability analysis of microsystems.
  • Keywords
    failure analysis; finite element analysis; micromechanical devices; optimisation; probability; reliability; soldering; deterministic optimization; failure analysis; finite element method; high-fidelity analytical tools; microsystems design; numerical analytical techniques; probabilistic optimization; probability based analytical tools; reduced order modeling; reliability analysis; solder joint optimization; Analytical models; Costs; Electromagnetic coupling; Electronics packaging; Equations; Failure analysis; Finite element methods; Optimization methods; Performance analysis; Read only memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1392-8
  • Electronic_ISBN
    978-1-4244-1392-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2007.4441412
  • Filename
    4441412