Spectral RTL Test Generation for Gate-Level Stuck-at Faults

We model RTL faults as stuck-at faults on primary inputs, primary outputs, and flip-flops. Tests for these faults are analyzed using Hadamard matrices for Walsh functions and random noise level at each primary input. This information then helps generate vector sequences. At the gate-level, a fault simulator and an integer linear program (ILP) compact the test sequences. We give results for four ITC´99 and four ISC AS´89 benchmark circuits, and an experimental processor. The RTL spectral vectors performed equally well on multiple gate-level implementations. Compared to a gate-level ATPG, RTL vectors produced similar or higher coverage in shorter CPU times