• DocumentCode
    2903570
  • Title

    An Observability Branch Coverage Metric Based on Dynamic Factored Use-Define Chains

  • Author

    Lv, Tao ; Liu, Ling-yi ; Zhao, Yang ; Li, Hua-wei ; Li, Xiao-wei

  • Author_Institution
    Inst. of Comput. Technol., Chinese Acad. of Sci., Beijing
  • fYear
    2006
  • fDate
    20-23 Nov. 2006
  • Firstpage
    89
  • Lastpage
    94
  • Abstract
    In this paper we propose an observability branch coverage metric (OBCM) based on dynamic factored use-define chains, along with its evaluation method. This technique exploits the efficiency of data-flow analysis rather than methods like fault simulation. Hence it can be easily integrated into HDL compilers or simulators. Experimental results show that OBCM can provide more meaningful coverage data for functional verification than traditional branch coverage metric (BCM)
  • Keywords
    automatic test pattern generation; data flow analysis; formal verification; hardware description languages; HDL compilers; data flow analysis; dynamic factored use-define chains; fault simulation; functional verification; observability branch coverage metric; Analytical models; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computers; Data analysis; Hardware design languages; Logic circuits; Observability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2006. ATS '06. 15th Asian
  • Conference_Location
    Fukuoka
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-2628-4
  • Type

    conf

  • DOI
    10.1109/ATS.2006.260998
  • Filename
    4030746