DocumentCode
2903570
Title
An Observability Branch Coverage Metric Based on Dynamic Factored Use-Define Chains
Author
Lv, Tao ; Liu, Ling-yi ; Zhao, Yang ; Li, Hua-wei ; Li, Xiao-wei
Author_Institution
Inst. of Comput. Technol., Chinese Acad. of Sci., Beijing
fYear
2006
fDate
20-23 Nov. 2006
Firstpage
89
Lastpage
94
Abstract
In this paper we propose an observability branch coverage metric (OBCM) based on dynamic factored use-define chains, along with its evaluation method. This technique exploits the efficiency of data-flow analysis rather than methods like fault simulation. Hence it can be easily integrated into HDL compilers or simulators. Experimental results show that OBCM can provide more meaningful coverage data for functional verification than traditional branch coverage metric (BCM)
Keywords
automatic test pattern generation; data flow analysis; formal verification; hardware description languages; HDL compilers; data flow analysis; dynamic factored use-define chains; fault simulation; functional verification; observability branch coverage metric; Analytical models; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computers; Data analysis; Hardware design languages; Logic circuits; Observability;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location
Fukuoka
ISSN
1081-7735
Print_ISBN
0-7695-2628-4
Type
conf
DOI
10.1109/ATS.2006.260998
Filename
4030746
Link To Document