Title :
An Application of IDD Spectrum Testing Method to the Fault Analysis
Author :
Sakaguchi, Kazuhiro
Author_Institution :
NEC Electronics Corporation
Abstract :
IDDQ information is very useful to localize faults in a LSI. But it is time consuming to discover test vectors which induce abnormal IDDQ. Since the IDD spectrum testing method can detect abnormal supply current easily, we can acquire the test vector information in a short time by the method. An application of the method is introduced and we show experimental results
Keywords :
integrated circuit testing; large scale integration; vectors; IDD spectrum testing; IDDQ information; LSI; fault analysis; localize faults; supply current; test vectors; Current measurement; Current supplies; Electronic equipment testing; Fault detection; Fault diagnosis; Frequency; Information analysis; Large scale integration; National electric code; Time measurement;
Conference_Titel :
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location :
Fukuoka
Print_ISBN :
0-7695-2628-4
DOI :
10.1109/ATS.2006.261005
