Title :
Substrate Noise Reduction Based On Noise Aware Cell Design
Author :
Salman, Emre ; Friedman, Eby G. ; Secareanu, Radu M. ; Hartin, Olin L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Rochester Univ., NY
Abstract :
A substrate biasing methodology is introduced based on modifying standard cells by inserting dedicated substrate contacts in those cells behaving as aggressive digital noise generators. These contacts are connected to a dedicated ground network. The proposed approach reduces two primary noise injection mechanisms: ground coupling and source/drain junction coupling. Limitations of the Kelvin biasing scheme are removed while achieving more than a 60% (9 dB) reduction in substrate noise at the cost of a 12% increase in area.
Keywords :
integrated circuit design; integrated circuit noise; mixed analogue-digital integrated circuits; substrates; Kelvin biasing scheme; dedicated substrate contacts; digital noise generators; ground coupling; noise aware cell design; noise injection mechanisms; source/drain junction coupling; substrate biasing; substrate noise reduction; Circuit noise; Costs; Coupling circuits; Integrated circuit noise; Kelvin; Noise generators; Noise reduction; Radio frequency; Semiconductor device noise; Substrates;
Conference_Titel :
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location :
New Orleans, LA
Print_ISBN :
1-4244-0920-9
Electronic_ISBN :
1-4244-0921-7
DOI :
10.1109/ISCAS.2007.378159
