Title :
Automation of IEEE 1149.6 Boundary Scan Synthesis in an ASIC Methodology
Author :
Foutz, Brian ; Chickermane, Vivek ; Li, Bing ; Linzer, Harry ; Kunselman, Gary
Abstract :
This paper describes an automated methodology to insert IEEE 1149.6 boundary scan in a production ASIC environment. The methodology includes updating the ASIC library to support the new test receiver component, updating the TAP controller logic and boundary cells, and finally providing support for embedded high speed I/O logic. Results from several industrial designs and example circuits are shown. These examples include multi-GHz serial I/O such as those used with serial ATA and PCI-Express
Keywords :
IEEE standards; application specific integrated circuits; boundary scan testing; embedded systems; logic testing; ASIC library; ASIC methodology; IEEE 1149.6; PCI-Express; TAP controller logic; boundary cells; boundary scan synthesis; embedded I/O logic; high speed I/O logic; multiGHz serial I/O; production ASIC environment; serial ATA; test receiver component; Application specific integrated circuits; Automatic testing; Automation; Circuit testing; Clocks; Firewire; Hysteresis; Libraries; Logic testing; Pins;
Conference_Titel :
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location :
Fukuoka
Print_ISBN :
0-7695-2628-4
DOI :
10.1109/ATS.2006.260959