Title :
Statistical generalization of performance-related heuristics for knowledge-lean applications
Author :
Ieumwananonthachai, Arthur ; Wah, Benjamin W.
Author_Institution :
Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
Abstract :
We present new results on the automated generalization of performance-related heuristics learned for knowledge-lean applications. We study methods to statistically generalize new heuristics learned for some small subsets of a problem space (using methods such as genetics-based learning) to unlearned problem subdomains. Our method uses a new statistical metric called probability of win. By assessing the performance of heuristics in a range-independent and distribution-independent manner, we can compare heuristics across problem subdomains in a consistent manner. To illustrate our approach, we show experimental results on generalizing heuristics learned for sequential circuit testing, VLSI cell placement and routing, and branch-and-bound search. We show that generalization can lead to new and robust heuristics that perform better than the original heuristics across problem instances of different characteristics
Keywords :
circuit CAD; circuit testing; generalisation (artificial intelligence); heuristic programming; learning (artificial intelligence); probability; statistical analysis; tree searching; VLSI cell placement; VLSI routing; branch-and-bound search; genetics-based learning; knowledge-lean applications; performance-related heuristics; probability of win; sequential circuit testing; statistical generalization; statistical metric; Art; Automatic control; Circuit testing; High performance computing; Learning systems; Machine learning; Probability; Process control; Robust control; Very large scale integration;
Conference_Titel :
Tools with Artificial Intelligence, 1995. Proceedings., Seventh International Conference on
Conference_Location :
Herndon, VA
Print_ISBN :
0-8186-7312-5
DOI :
10.1109/TAI.1995.479511