Title :
Mechanism and Fracturing Modes of Solder Joints Subjected to High-speed Shearing Forces
Author :
Yeh, Chang-Lin ; Lai, Yi-Shao
Author_Institution :
Adv. Semicond. Eng. Inc., Kaohsiung
Abstract :
We develop a novel numerical simulation methodology by using LS-DYNA combining with erosion/interface fracturing elements and mass-scaled scheme in tins paper to research on transient structural responses of a single package-level solder joint subjected to high-speed (>100 mm/s) ball shear load. The proposed simulation procedure is benchmarked by comparing with experimental data obtained by using INSTRON Microimpact tester. After the numerical model is validated, transition conditions between IMC fracturing and bulk solder fracturing modes as well as relation between impact force and joint adhesion of interfaces are identified numerically therefore.
Keywords :
shearing; solders; LS DYNA; erosion/interface fracturing elements; fracturing modes; high speed shearing forces; mass scaled scheme; mechanism modes; solder joints; transient structural responses; Benchmark testing; Bonding; Capacitive sensors; Numerical models; Numerical simulation; Semiconductor device packaging; Shearing; Soldering; Stress; Vehicles;
Conference_Titel :
Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-1392-8
Electronic_ISBN :
978-1-4244-1392-8
DOI :
10.1109/ICEPT.2007.4441506