Title :
Effect of Vacuum Environments on Performance and Reliability of Electronic Components and Packages for Space Applications
Author :
Sharma, Ashok ; Teverovsky, Alexander
Author_Institution :
2-MEI, Greenbelt
Abstract :
This work summarizes experience obtained at the NASA/Goddard Space Flight Center during parts testing, failure analysis and evaluation studies, where vacuum conditions resulted in substantial effect on performance degradation and failures of certain parts and packages for space applications. This test data is very important for space applications vacuum environments because of issues and concerns that require special evaluation of components and packaging issues to assure long term reliable operation.
Keywords :
electronic equipment testing; electronics packaging; failure analysis; reliability; space vehicle electronics; electronic component performance; electronic component reliability; evaluation study; failure analysis; parts testing; term reliable operation; test data; vacuum condition; vacuum environment; DC-DC power converters; Electronic components; Electronics packaging; Fatigue; Flashover; Hermetic seals; Relays; Soldering; Testing; Wire;
Conference_Titel :
Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-1392-8
Electronic_ISBN :
978-1-4244-1392-8
DOI :
10.1109/ICEPT.2007.4441516
