DocumentCode
2905511
Title
Decoupling Binary-Level Dynamic Test Generation from Specific Architecture Details
Author
Li, Gen ; Lu, Kai ; Zhang, Ying ; Lu, Xicheng ; Zhang, Wei
Author_Institution
Sch. of Comput., Nat. Univ. of Defence Technol., Changsha, China
fYear
2009
fDate
24-26 Nov. 2009
Firstpage
1041
Lastpage
1046
Abstract
Dynamic test generation approach is becoming increasingly popular to find security vulnerabilities in software. More and more research institutes and organizations use this approach to find security vulnerabilities in binary code. However, the existing binary level dynamic test generation approaches and tools are not retargetable, and can only find vulnerabilities in binaries for a specific ISA. This paper presents a new binary-level dynamic test generation technique and a tool, ReTBLDTG, short for retargetable binary-level dynamic test generation, that implements this technique. Unlike other such techniques that can operate only on binaries in a specific ISA, ReTBLDTG takes binaries of any ISAs as input and dynamically generates new inputs that exercise different control paths in the program, which may lead to security vulnerabilities. ReTBLDTG defines a meta instruction set architecture (MetalSA); ReTBLDTG maps the execution information, which is collected during the binary source code execution, to MetalSA; and symbolic execution, constraint collection and constraint solver operates on MetalSA, thus making these processes ISA-independent. We have implemented our ReTBLDTG, retargeted it to 32-bit x86, PowerPC and Sparc ISAs, and used it to automatically find the six known bugs in the six benchmarks. Our results indicate that our ReTBLDTG can be easily retargeted to any ISA with only a few overheads; and ReTBLDTG can effectively find bugs located deep within large applications from their binaries for 32-bit x86, PowerPC or Sparc ISA.
Keywords
constraint handling; instruction sets; program compilers; program control structures; program debugging; security of data; software tools; ReTBLDTG tool; binary code; binary source code execution; constraint collection; constraint solver; meta instruction set architecture; program bug; program control path; retargetable binary-level dynamic test generation; security vulnerability; symbolic execution; Arithmetic; Binary codes; Computer bugs; Constraint theory; Information security; Information technology; Instruction sets; National security; Software testing; Surface-mount technology; Dynamic Test Generation; ISA-Independent; Retargetable;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Sciences and Convergence Information Technology, 2009. ICCIT '09. Fourth International Conference on
Conference_Location
Seoul
Print_ISBN
978-1-4244-5244-6
Electronic_ISBN
978-0-7695-3896-9
Type
conf
DOI
10.1109/ICCIT.2009.118
Filename
5368752
Link To Document