DocumentCode :
2906505
Title :
Error Tolerance of DNA Self-Assembly by Monomer Concentration Control
Author :
Jang, Byunghyun ; Kim, Yong-Bin ; Lombardi, Fabrizio
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA
fYear :
2006
fDate :
4-6 Oct. 2006
Firstpage :
89
Lastpage :
97
Abstract :
This paper proposes the control of monomer concentration as a novel improvement of the kinetic tile assembly model (kTAM) to reduce the error rate in DNA self-assembly. Tolerance to errors in this process is very important for manufacturing highly dense ICs; the proposed technique significantly decreases error rates (i.e. it increases error tolerance) by controlling the concentration of monomers. A stochastic analysis based on a new state model is presented. Error rates reductions of at least 10% are found by evaluating the proposed scheme comparing to a scheme with constant concentration. One of the significant advantages of the proposed scheme is that it doesn´t entail an overhead such as increase in size and a slow growth, while still achieving a significant reduction in error rate
Keywords :
DNA; biomolecular electronics; errors; integrated circuit design; molecules; nanotechnology; self-assembly; stochastic processes; DNA self-assembly; IC manufacturing; error rates reductions; error tolerance; kinetic tile assembly model; monomer concentration control; stochastic analysis; Assembly; Computer errors; DNA; Error analysis; Error correction; Kinetic theory; Manufacturing processes; Self-assembly; Stochastic processes; Tiles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on
Conference_Location :
Arlington, VA
ISSN :
1550-5774
Print_ISBN :
0-7695-2706-X
Type :
conf
DOI :
10.1109/DFT.2006.29
Filename :
4030919
Link To Document :
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