A Novel Methodology for Functional Test Data Compression

Author

Hashempour, Hamidreza ; Lombardi, Fabrizio

Author_Institution

Dept. of ECE, Northeastern Univ., Boston, MA

fYear

2006

fDate

Oct. 2006

Firstpage

128

Lastpage

135

Abstract

This paper presents a novel approach for compressing functional test data in automatic test equipment (ATE). A practical technique is presented for 2 dimensional (2D) reordering of test data in which additionally to test vector reordering, column reordering is also applied. An ATE based approach to extract the original test vectors from the 2D ordered data is presented. The advantage of the approach is substantiated using the figure of merit of entropy for the 2D ordered test data of ISCAS benchmark circuits

Keywords

automatic test equipment; data compression; 2D ordered test data; 2D reordering; ATE; automatic test equipment; column reordering; functional test data compression; vector reordering; Automatic test equipment; Automatic testing; Circuit testing; Costs; Data mining; Entropy; Semiconductor device manufacture; System testing; System-on-a-chip; Test data compression;

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on

Conference_Location

Arlington, VA

ISSN

1550-5774

Print_ISBN

0-7695-2706-X

Type

conf

DOI

10.1109/DFT.2006.9

Filename

4030923

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2906568