• DocumentCode
    2907153
  • Title

    A Closed-Form Expression of Instantaneous Bit Error Rate for BIC-OFDM Systems

  • Author

    Shin, Cheolkyu ; Park, Hyuncheol

  • Author_Institution
    Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
  • fYear
    2010
  • fDate
    23-27 May 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The instantaneous bit error rate (I-BER) is a direct representation of system performance given a particular channel realization. The I-BER knowledge enables wireless system to combat fading channel impairments by properly adapting transmission parameters. In this paper, we derive the I-BER for a bit-interleaved coded orthogonal frequency division multiplexing (BIC-OFDM) system. In high signal-to-noise ratio (SNR) regions, under the assumption that an erroneous symbol contains only one bit error, a codeword pairwise error probability (PEP) is approximated by a symbol PEP. The above assumption is used again to evaluate the symbol PEP for an arbitrary QAM with Gray labeling. Compared with a previously obtained result, the new I-BER expression provides a tighter upper bound for convolutional coded BIC-OFDM systems. We also discuss a practical use of the I-BER in a link adaptation process.
  • Keywords
    Gray codes; OFDM modulation; convolutional codes; error statistics; fading channels; quadrature amplitude modulation; radio links; Gray labeling; arbitrary QAM; bit-interleaved coded orthogonal frequency division multiplexing system; closed-form expression; codeword pairwise error probability; convolutional code; fading channel impairments; instantaneous bit error rate; link adaptation process; signal-to-noise ratio; symbol pairwise error probability; Bit error rate; Closed-form solution; Fading; Interleaved codes; Labeling; OFDM; Pairwise error probability; Quadrature amplitude modulation; Signal to noise ratio; System performance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications (ICC), 2010 IEEE International Conference on
  • Conference_Location
    Cape Town
  • ISSN
    1550-3607
  • Print_ISBN
    978-1-4244-6402-9
  • Type

    conf

  • DOI
    10.1109/ICC.2010.5502325
  • Filename
    5502325