Title :
Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies
Author :
La Haye, Michelle L. ; Jung, Cory ; Chen, David ; Chapman, Glenn H. ; Dudas, Jozsef
Author_Institution :
Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC
Abstract :
A fault tolerant active pixel sensor (FTAPS) has been designed and fabricated to correct for point defects that occur in CMOS image sensors both at manufacturing and over the lifetime of the sensor. For some time it has been known that fabrication of CMOS image sensors in processes less than 0.35mum would generate significant performance changes, yet imagers are being fabricated in 0.18mum technology or smaller. Therefore the characteristics of the FTAPS are presented for pixels fabricated in both a standard 0.18mum and 0.35mum CMOS process and compared for consistency
Keywords :
CMOS image sensors; fault tolerant computing; point defects; 0.18 micron; 0.35 micron; CMOS image sensors; CMOS process; FTAPS; fault tolerant active pixel sensors; point defects; CMOS image sensors; CMOS technology; Cameras; Fabrication; Fault tolerance; Image sensors; Manufacturing; Pixel; Switches; Testing;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on
Conference_Location :
Arlington, VA
Print_ISBN :
0-7695-2706-X
DOI :
10.1109/DFT.2006.31
