• DocumentCode
    2907202
  • Title

    Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies

  • Author

    La Haye, Michelle L. ; Jung, Cory ; Chen, David ; Chapman, Glenn H. ; Dudas, Jozsef

  • Author_Institution
    Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC
  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    448
  • Lastpage
    456
  • Abstract
    A fault tolerant active pixel sensor (FTAPS) has been designed and fabricated to correct for point defects that occur in CMOS image sensors both at manufacturing and over the lifetime of the sensor. For some time it has been known that fabrication of CMOS image sensors in processes less than 0.35mum would generate significant performance changes, yet imagers are being fabricated in 0.18mum technology or smaller. Therefore the characteristics of the FTAPS are presented for pixels fabricated in both a standard 0.18mum and 0.35mum CMOS process and compared for consistency
  • Keywords
    CMOS image sensors; fault tolerant computing; point defects; 0.18 micron; 0.35 micron; CMOS image sensors; CMOS process; FTAPS; fault tolerant active pixel sensors; point defects; CMOS image sensors; CMOS technology; Cameras; Fabrication; Fault tolerance; Image sensors; Manufacturing; Pixel; Switches; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2706-X
  • Type

    conf

  • DOI
    10.1109/DFT.2006.31
  • Filename
    4030957