DocumentCode
2907202
Title
Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies
Author
La Haye, Michelle L. ; Jung, Cory ; Chen, David ; Chapman, Glenn H. ; Dudas, Jozsef
Author_Institution
Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC
fYear
2006
fDate
Oct. 2006
Firstpage
448
Lastpage
456
Abstract
A fault tolerant active pixel sensor (FTAPS) has been designed and fabricated to correct for point defects that occur in CMOS image sensors both at manufacturing and over the lifetime of the sensor. For some time it has been known that fabrication of CMOS image sensors in processes less than 0.35mum would generate significant performance changes, yet imagers are being fabricated in 0.18mum technology or smaller. Therefore the characteristics of the FTAPS are presented for pixels fabricated in both a standard 0.18mum and 0.35mum CMOS process and compared for consistency
Keywords
CMOS image sensors; fault tolerant computing; point defects; 0.18 micron; 0.35 micron; CMOS image sensors; CMOS process; FTAPS; fault tolerant active pixel sensors; point defects; CMOS image sensors; CMOS technology; Cameras; Fabrication; Fault tolerance; Image sensors; Manufacturing; Pixel; Switches; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on
Conference_Location
Arlington, VA
ISSN
1550-5774
Print_ISBN
0-7695-2706-X
Type
conf
DOI
10.1109/DFT.2006.31
Filename
4030957
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