• DocumentCode
    2907459
  • Title

    Fault tolerant FIR filters using hamming codes

  • Author

    Liu, Shih-Fu ; Reviriego, Pedro ; Maestro, Juan Antonio

  • Author_Institution
    Univ. Antonio de Nebrija, Madrid, Spain
  • fYear
    2009
  • fDate
    14-18 Sept. 2009
  • Firstpage
    493
  • Lastpage
    496
  • Abstract
    Hamming Codes have been used to protect different circuits against Single Event Upsets (SEUs). In this paper, the use of Hamming on FIR Filters is studied in order to provide optimized and efficient protection techniques.
  • Keywords
    FIR filters; Hamming codes; fault tolerance; Hamming code; SEU; fault tolerant FIR filter; single event upset; Application specific integrated circuits; Decoding; Field programmable gate arrays; Finite impulse response filter; Logic gates; Table lookup; Tunneling magnetoresistance; Digital filters; Hamming codes; Reliability; Single Event Upset (SEU);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
  • Conference_Location
    Bruges
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0492-5
  • Electronic_ISBN
    0379-6566
  • Type

    conf

  • DOI
    10.1109/RADECS.2009.5994701
  • Filename
    5994701