DocumentCode
2907459
Title
Fault tolerant FIR filters using hamming codes
Author
Liu, Shih-Fu ; Reviriego, Pedro ; Maestro, Juan Antonio
Author_Institution
Univ. Antonio de Nebrija, Madrid, Spain
fYear
2009
fDate
14-18 Sept. 2009
Firstpage
493
Lastpage
496
Abstract
Hamming Codes have been used to protect different circuits against Single Event Upsets (SEUs). In this paper, the use of Hamming on FIR Filters is studied in order to provide optimized and efficient protection techniques.
Keywords
FIR filters; Hamming codes; fault tolerance; Hamming code; SEU; fault tolerant FIR filter; single event upset; Application specific integrated circuits; Decoding; Field programmable gate arrays; Finite impulse response filter; Logic gates; Table lookup; Tunneling magnetoresistance; Digital filters; Hamming codes; Reliability; Single Event Upset (SEU);
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
Conference_Location
Bruges
ISSN
0379-6566
Print_ISBN
978-1-4577-0492-5
Electronic_ISBN
0379-6566
Type
conf
DOI
10.1109/RADECS.2009.5994701
Filename
5994701
Link To Document