• DocumentCode
    2907686
  • Title

    Heavy ion testing at the galactic cosmic ray energy peak

  • Author

    Pellish, Jonathan A. ; Xapsos, Michael A. ; LaBel, Kenneth A. ; Marshall, Paul W. ; Heidel, David F. ; Rodbell, Kenneth P. ; Hakey, Mark C. ; Dodd, Paul E. ; Shaneyfelt, Marty R. ; Schwank, James R. ; Baumann, Robert C. ; Deng, Xiaowei ; Marshall, Andrew

  • Author_Institution
    Radiat. Effects & Anal. Group, NASA/GSFC, Greenbelt, MD, USA
  • fYear
    2009
  • fDate
    14-18 Sept. 2009
  • Firstpage
    559
  • Lastpage
    562
  • Abstract
    A 1 GeV/u 56Fe ion beam allows for true 90° tilt irradiations of various microelectronic components and reveals relevant upset trends for an abundant element at the GCR flux energy peak.
  • Keywords
    galactic cosmic rays; integrated circuit testing; ion beams; ions; iron; Fe; galactic cosmic ray energy peak; heavy ion testing; ion beam; microelectronic components; tilt irradiations; CMOS integrated circuits; Field programmable gate arrays; Laboratories; NASA; Radiation effects; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
  • Conference_Location
    Bruges
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0492-5
  • Electronic_ISBN
    0379-6566
  • Type

    conf

  • DOI
    10.1109/RADECS.2009.5994714
  • Filename
    5994714
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2907686