Title :
Characterization of new radiation hardened bipolar operational amplifiers
Author :
Chaumont, Géraldine ; Cornanguer, Benoît ; Briand, Patrick ; Prugne, Christophe ; Malou, Florence
Author_Institution :
STMicroelectronics, Rennes, France
Abstract :
New operational amplifiers have been ELDRS and heavy ions characterized. This paper presents the TID results at high and low dose rate and SEE tests results.
Keywords :
operational amplifiers; radiation hardening (electronics); SEE tests; TID; heavy ions; low dose rate; radiation hardened bipolar operational amplifiers; single event effect; Bandwidth; Facsimile; Feedback amplifier; Ions; Radiation effects; Radiation hardening; Single Event Effect (SEE); dose-rate; operational amplifier;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
Conference_Location :
Bruges
Print_ISBN :
978-1-4577-0492-5
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2009.5994727
