• DocumentCode
    2908552
  • Title

    3-Weight Pseudo-Random Test Generation Based on a Deterministic Test Set

  • Author

    Pomeranz, Irith ; Reddy, Sudhakar M.

  • Author_Institution
    University of Iowa
  • fYear
    1992
  • fDate
    4-7 Jan 1992
  • Firstpage
    148
  • Lastpage
    153
  • Keywords
    Automatic test pattern generation; Benchmark testing; Circuit faults; Circuit testing; Cities and towns; Electrical fault detection; Fault detection; Hardware; Legged locomotion; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1992. Proceedings., The Fifth International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-2465-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1992.658037
  • Filename
    658037
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2908552