• DocumentCode
    2909100
  • Title

    Scanning Tunneling Microscopy of the Si-Mosfet Used for Quantized Hall Resistance Measurements

  • Author

    Khaikin, M.S. ; Edel´man, V.S. ; Troyanovskii, A.M. ; Pudalov, V.M. ; Semenchinsky, S.G.

  • Author_Institution
    Institute for Physical Problems, Academy of Sciences of the USSR
  • fYear
    1988
  • fDate
    7-10 June 1988
  • Firstpage
    325
  • Lastpage
    326
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements, 1988. CPEM 88 Digest. 1988 Conference on
  • Conference_Location
    Ibaraki, Japan
  • Type

    conf

  • DOI
    10.1109/CPEM.1988.671324
  • Filename
    671324
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2909100