Yield Predictive Model Characterization In Analog Circuit Design

A new technique is presented that produces a characterized yield-predictive model by incorporating yield into the goal function directly. We explore the trade off between performance functions and yield estimation during the design optimization process. Through the integration of yield into the optimization process, the trade off between the performance functions can be better treated that able to produce a higher yield. This concept together with full circuit simulation and global search algorithm provides a robust solution across process corners and parameter variations. Encouraging results have been obtained and an example is presented to demonstrate the technique.