DocumentCode
2909474
Title
An Effective Approach For Subtreshold And Gate Leakage Power Estimation Of SRAM
Author
Zhang, Feng ; Zhang, Ge ; Yang, Yi ; Wan, Jun
Author_Institution
CAS, Beijing
fYear
2007
fDate
26-28 Sept. 2007
Firstpage
325
Lastpage
328
Abstract
The leakage current in SRAM is the vital factor for the low power processor design. In this paper we develop a fast approach to calculate the total leakage power of SRAM, considering the subthreshold leakage (Isub) and gate leakage (Igate).This method is proposed on the SRAM special architecture, using the stack factors as the average factor to compute the Isub and using the statistical algorithm to estimate the gate leakage power. The method does not need to be much considered on the working state of SRAM and it can be applied without much spice simulation and suitable for SRAM leakage power computing at the different process. We use this method to test a number of SRAM circuits in the 0.18 mum, 0.13 mum, 90 nm and 65 nm technology and demonstrate the accuracy within less than 5% of hspice on average. This technique is much useful for the system designers to estimate the power earlier, and can effectively improve the power management of the processors and shorten the design time.
Keywords
SRAM chips; leakage currents; SRAM; hspice; leakage current; power management; subtreshold-gate leakage power estimation; Circuit simulation; Circuit testing; Computational modeling; Computer architecture; Energy management; Gate leakage; Leakage current; Process design; Random access memory; Subthreshold current;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Circuits, 2007. ISIC '07. International Symposium on
Conference_Location
Singapore
Print_ISBN
978-1-4244-0797-2
Electronic_ISBN
978-1-4244-0797-2
Type
conf
DOI
10.1109/ISICIR.2007.4441864
Filename
4441864
Link To Document