DocumentCode :
2910634
Title :
The Year 2000 impact on automated testing
Author :
Eaken, Wanda ; Hitt, George
Author_Institution :
Battelle Memorial Inst., Ogden, UT, USA
fYear :
1998
fDate :
24-27 Aug 1998
Firstpage :
661
Lastpage :
664
Abstract :
Both the US military and industry rely on automatic testing to verify the quality of manufacture and repair. Many testers still rely on computers designed and manufactured in the early 1980´s. This includes systems using embedded controllers. Year 2000 problems can surface in computer operating systems, compilers, test programs, and in embedded systems. Until the impact of the Y2K “bug” is addressed, the risk of test program failure is unknown in most legacy automatic test systems. Problems may include embedded controllers in proprietary designs, old operating systems, and unique test program code. This paper addresses the potential problem areas in automatic testing, and suggests an approach for determining the best course of action. In order to evaluate the impact, a complete systems inventory must be done to identify all potential sources of problems. Little attention has been paid to the legacy automated test systems and the potential impact of the Y2K problem on such systems. Although newer systems are less likely to be affected no one can be sure until a complete inventory and test has been accomplished
Keywords :
automatic test equipment; automatic test software; automatic testing; data integrity; embedded systems; program debugging; software maintenance; Y2K bug; Year 2000 problems; automated testing; computers; embedded controllers; legacy automatic test systems; millennium bug; operating systems; systems inventory; test program code; test program failure; Automatic control; Automatic testing; Computer aided manufacturing; Control systems; Defense industry; Electrical equipment industry; Manufacturing industries; Military computing; Operating systems; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE
Conference_Location :
Salt Lake City, UT
ISSN :
1088-7725
Print_ISBN :
0-7803-4420-0
Type :
conf
DOI :
10.1109/AUTEST.1998.713513
Filename :
713513
Link To Document :
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