Title :
A New Variable Testability Measure: a Concept for Data-Flow Testability Evaluation
Author :
Jamoussi, M. ; Kaminaka, B. ; Mukhedkar, D.
Author_Institution :
E-Cole Polytechnique de Montreal
Keywords :
Algorithm design and analysis; Circuit synthesis; Circuit testing; Control systems; Controllability; Costs; Hardware; High level synthesis; Observability; Process design;
Conference_Titel :
VLSI Design, 1992. Proceedings., The Fifth International Conference on
Print_ISBN :
0-8186-2465-5
DOI :
10.1109/ICVD.1992.658054
