• DocumentCode
    2912773
  • Title

    Electrostatic manipulator for 300-mm wafers

  • Author

    Jin, Ju ; Yih, T.C. ; Ohsumi, Y.

  • Author_Institution
    Dept. of Mech. Eng., Florida Int. Univ., Miami, FL, USA
  • Volume
    3
  • fYear
    1997
  • fDate
    5-9 Oct 1997
  • Firstpage
    1990
  • Abstract
    This paper presents the developments in contactless mechanisms for use in the manufacturing process of semiconductor devices, an electrostatic manipulator for a 300-mm silicon wafer. The novel aspects of this manipulator are that not only can it directly levitate a wafer via electrostatic forces and then transport it by controlling the movement of electrodes, but it can also keep the net surface potential of the wafer near zero volts. As a result, if greatly reduces the contamination of the wafer surface by dust particles. In this paper, a brief review of the basic principle of electrostatic levitation is presented. It is followed by a description of the structure of the manipulator, including the electrodes pattern, position and orientation control method, voltage-application pattern, motion control of the levitation unit, and the operational procedure. Experimental results which demonstrate completely contactless handling of a 300-mm silicon wafer are also presented
  • Keywords
    electrodes; electronics industry; electrostatic devices; elemental semiconductors; position control; semiconductor device manufacture; silicon; 300 mm; Si; contactless mechanisms; dust particles; electrode orientation control; electrodes movement; electrodes pattern; electrodes position control; electrostatic forces; electrostatic levitation; electrostatic manipulator; net surface potential; operational procedure; semiconductor devices manufacture; silicon wafer; Electrodes; Electrostatic levitation; Friction; Magnetic levitation; Manipulators; Mechanical engineering; Pulp manufacturing; Semiconductor devices; Silicon; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1997. Thirty-Second IAS Annual Meeting, IAS '97., Conference Record of the 1997 IEEE
  • Conference_Location
    New Orleans, LA
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-4067-1
  • Type

    conf

  • DOI
    10.1109/IAS.1997.626334
  • Filename
    626334