Extraction of the frequency-dependent characteristic impedance of transmission lines using TDR measurements

Author

Kim, Woopoung ; Swaminathan, Madhavan ; Li, Y.L.

Author_Institution

Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA

fYear

2000

fDate

2000

Firstpage

191

Lastpage

197

Abstract

This paper discusses a method for measuring the frequency-dependent characteristic impedance of transmission lines using time domain reflectometry (TDR) measurements with an open, short and load calibration. Conventional characterization methods using a network analyzer require precise information on the structure of the transmission line to extract the characteristic impedance, which can be cumbersome. In TDR measurements, the effect of the load can be removed using time windowing, which can reduce the error in the measurements. The results of TDR measurements have been compared with those of a network analyzer to quantify the measurement error. Both a low pass filter and a PCB microstrip line have been characterized using this method

Keywords

UHF circuits; calibration; characteristics measurement; electric impedance; high-frequency transmission lines; low-pass filters; microstrip lines; network analysers; printed circuit testing; time-domain reflectometry; PCB microstrip line; TDR measurements; characteristic impedance; frequency-dependent characteristic impedance; load calibration; low pass filter; measurement error; network analyzer; time domain reflectometry; time windowing; transmission line structure; transmission lines; Calibration; Data mining; Frequency measurement; Impedance measurement; Information analysis; Low pass filters; Measurement errors; Reflectometry; Time measurement; Transmission line measurements;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics Packaging Technology Conference, 2000. (EPTC 2000). Proceedings of 3rd

Print_ISBN

0-7803-6644-1

Type

conf

DOI

10.1109/EPTC.2000.906372

Filename

906372