• DocumentCode
    2913267
  • Title

    Analysis of lightning-induced current and voltages on 500 kV EHV double circuit transmission lines of type DL3° and DT 20° in lightning protection system

  • Author

    Jaipradidtham, Chamni

  • Author_Institution
    Dept. of Electr. Eng., Kasem Bundit Univ., Bangkok, Thailand
  • Volume
    C
  • fYear
    2004
  • fDate
    21-24 Nov. 2004
  • Firstpage
    385
  • Abstract
    This paper presents a method to consider of the current and voltage induced on 500 kV EHV double circuit transmission lines of type DL3° and DT 20° in lightning protection system. These analyses are based on modeling lightning return stroke as well as on coupling the electromagnetic fields of the stroke channel to the line. The ground conductivity influences both the electric field as well as the coupling mechanism and hence the magnitude and wave shape of the induced voltage. The presence of other conductors affects the induced voltage of a conductor, the analysis of current and voltage induced on an overhead line by lightning strokes to nearby ground. The simulation results show that this study analyses for assuming ground as a perfect conductor and for the stabilization of estimating such lightning induced outages of a long distance power transmission system.
  • Keywords
    electromagnetic fields; lightning protection; overhead line conductors; power overhead lines; power transmission protection; 500 kV; EHV double circuit transmission lines; coupling mechanism; electric field; electromagnetic fields; ground conductivity; lightning protection system; lightning return stroke; lightning-induced current; lightning-induced voltages; long distance power transmission system; overhead line; Conductors; Coupling circuits; Distributed parameter circuits; Electromagnetic analysis; Electromagnetic coupling; Electromagnetic modeling; Lightning protection; Optical coupling; Power transmission lines; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2004. 2004 IEEE Region 10 Conference
  • Print_ISBN
    0-7803-8560-8
  • Type

    conf

  • DOI
    10.1109/TENCON.2004.1414788
  • Filename
    1414788