DocumentCode :
2913849
Title :
ZnO Surge Arresters Diagnosis Using Microcontroller
Author :
Lira, Jose G A ; Macedo, Euler C T ; Costa, Edson G. ; Freire, Raimundo C S ; Luciano, Benedito A.
Author_Institution :
Campina Grande Fed. Univ., Parana
fYear :
2007
fDate :
1-3 May 2007
Firstpage :
1
Lastpage :
6
Abstract :
Surge arresters are equipments used for the power electrical systems protection. They limit the voltage level during the occurrence of switching and atmospheric surges. A surge arrester failure can cause the equipments insulation breakdown or flashover, or even the surge arrester explosion. To avoid this problem, the maintenance of these equipments is made by means of regular monitoring. Measurement of the resistive leakage current and analysis of its harmonic components is one of the most used techniques to evaluate the degradation level of metal oxide surge arresters. In this paper is presented a new measurement technique for the resistive component of leakage current based on the orthogonal position between this component and the capacitive component. The technique is accomplished by means of inductive current sensors based on nanocrystalline alloys and a PIC microcontroller to provide the measurement of the first, third and fifth harmonic components of the resistive leakage current in the arrester.
Keywords :
arresters; flashover; insulation; leakage currents; microcontrollers; nanostructured materials; power system protection; zinc compounds; PIC microcontroller; ZnO; inductive current sensors; insulation breakdown; leakage current; nanocrystalline alloys; power electrical systems protection; power equipment flashover; surge arrester failure; surge arresters diagnosis; Arresters; Current measurement; Electric breakdown; Insulation; Leakage current; Microcontrollers; Power system protection; Surge protection; Voltage; Zinc oxide; Metal oxide surge arresters; ZnO varistor; harmonic analysis; leakage current;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE
Conference_Location :
Warsaw
ISSN :
1091-5281
Print_ISBN :
1-4244-0588-2
Type :
conf
DOI :
10.1109/IMTC.2007.379142
Filename :
4258394
Link To Document :
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