Title :
Dielectric recovery behaviors after low current interruption measured by submicrosecond voltage impulses
Author :
Wang, Zhenxing ; Geng, Yingsan ; Yan, Peng ; Liu, Zhiyuan
Author_Institution :
State Key Lab. of Electr. Insulation & Power Equip., Xi´´an Jiaotong Univ., Xi´´an, China
fDate :
Aug. 30 2010-Sept. 3 2010
Abstract :
Dielectric recovery behaviors after current extinction have a decisive influence on the performance of a vacuum circuit breaker (VCB) because it ultimately determines the interruption capacity of the VCB. In order to understand the dielectric recovery behaviors, submicrosecond voltage impulses peaked at 90kV with a rate of rise of ~6×108kV/s were applied upon a pair of electrodes in vacuum interrupters. The electrodes were butt type and they were made of Cu and CuCr25, respectively. The contact diameter was 12mm. The arc current frequency was 50Hz and the arcing time was about 9ms. The results showed that the breakdown voltage in the dielectric recovery processes plateaued between 50kV to 80kV from 10μs to 60μs after current zero for Cu contact material at peak arc current 1500A and the breakdown voltage was between 70kV to 90kV for CuCr25 contact material. Moreover, arc current varied from 550A to 2500A (peak value) had no significant effect on the mean breakdown values of Cu and CuCr25 contact materials.
Keywords :
copper alloys; electric breakdown; vacuum circuit breakers; CuCr; breakdown voltage; contact materials; current 1500 A; dielectric recovery behaviors; low current interruption; submicrosecond voltage impulses; time 10 mus to 60 mus; vacuum circuit breaker; voltage 50 kV to 80 kV; voltage 70 kV to 90 kV; voltage 90 kV; Copper; Dielectrics; Electrodes; Interrupters; Materials; Switches; Voltage measurement;
Conference_Titel :
Discharges and Electrical Insulation in Vacuum (ISDEIV), 2010 24th International Symposium on
Conference_Location :
Braunschweig
Print_ISBN :
978-1-4244-8367-9
Electronic_ISBN :
1093-2941
DOI :
10.1109/DEIV.2010.5625831