Enhanced Time Base Jitter Compensation of Sine Waves

Author

Verbeyst, Frans ; Rolain, Yves ; Pintelon, Rik ; Schoukens, Johan

Author_Institution

Vrije Univ. Brussel, Brussels

fYear

2007

fDate

1-3 May 2007

Firstpage

1

Lastpage

5

Abstract

The goal of this paper is to estimate the amplitude of a sine wave in the presence of time base jitter, time base drift, time base distortion and additive noise. This work is motivated by a comparative study of the amplitude distortion estimated using a nose-to-nose and electro-optic sampling based calibration of a high-frequency sampling oscilloscope. It uses the exact expression of the variance of a sine wave in the presence of normally distributed additive and jitter noise, instead of a Taylor approximation of this expression.

Keywords

calibration; jitter; oscilloscopes; additive noise; amplitude distortion estimation; electrooptic sampling; enhanced time base jitter compensation; high frequency sampling oscilloscope; nose-to-nose sampling; sine waves; time base distortion; time base drift; Additive noise; Amplitude estimation; Calibration; Distortion measurement; Jitter; NIST; Noise measurement; Oscilloscopes; Phase distortion; Sampling methods; high-frequency sampling oscilloscopes; system identification; time base distortion; time base drift; time base jitter;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE

Conference_Location

Warsaw

ISSN

1091-5281

Print_ISBN

1-4244-0588-2

Type

conf

DOI

10.1109/IMTC.2007.379391

Filename

4258453