DocumentCode
2917047
Title
A vision-based approach for surface roughness assessment at micro and nano scales
Author
Al-Kindi, Ghassan A. ; Shirinzadeh, Bijan ; Zhong, Yongmin
Author_Institution
Dept. of Mech. Eng., Univ. of Technol., Baghdad
fYear
2008
fDate
17-20 Dec. 2008
Firstpage
1903
Lastpage
1908
Abstract
This paper presents a vision-based approach for valid assessment of surface roughness in both micro-scale and nano-scale regions. To enable data comparisons, three sets of surface data in the micro and nano regions are acquired by using a CCD camera, a video-based optical microscope and a stylus instrument. Data filtering and analysis procedures are applied to the acquired data. Results for computation of roughness parameters by using vision data provide adequate values for assessment of surface roughness in the manner as similar as stylus based technique. No obvious changes in the computed roughness parameter values are resulted from the micro and nano regions. In the nano region, a cavity graphs technique provides distinguishable forms of graphs that tend to more gradual increase of the cavity percentage to denote the collection of the macro surface details. In addition, an auto correlation technique applied in the nano region succeeds to discriminate the surface irregularities relationship with respect to their periodicity and randomness. The overall acquired results indicate that vision systems are a valid source of data for reliable surface roughness evaluation in both micro/nano-scale regions. The results are very useful in achieving commercial 3D vision based micro-nano roughness measurement systems for industrial applications.
Keywords
CCD image sensors; computer vision; data analysis; optical microscopes; surface roughness; surface topography measurement; CCD camera; cavity graphs technique; data analysis; data filtering; microscale region; nanoscale region; roughness measurement systems; stylus instrument; surface roughness assessment; video-based optical microscope; vision-based approach; Charge coupled devices; Charge-coupled image sensors; Computer vision; Data analysis; Filtering; Instruments; Optical filters; Optical microscopy; Rough surfaces; Surface roughness; image acquisition and analysis; machine vision; micro and nano-scale regions; surface roughness measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Control, Automation, Robotics and Vision, 2008. ICARCV 2008. 10th International Conference on
Conference_Location
Hanoi
Print_ISBN
978-1-4244-2286-9
Electronic_ISBN
978-1-4244-2287-6
Type
conf
DOI
10.1109/ICARCV.2008.4795819
Filename
4795819
Link To Document