DocumentCode :
2918144
Title :
Electrical conductivity characteristics of TiO2 thin film
Author :
Sarah, M.S.P. ; Musa, M.Z. ; Asiah, M.N. ; Rusop, M.
Author_Institution :
Solar Cell Lab., UiTM, Shah Alam, Malaysia
fYear :
2010
fDate :
11-14 April 2010
Firstpage :
361
Lastpage :
364
Abstract :
Titanium Dioxide (TiO2) thin film has been synthesized using sol-gel method and deposited onto glass substrates using spin coating technique. These thin films are then annealed at various temperatures. The electrical and structural characterizations of the as deposited and annealed films were carried out using IV measurement with 4-point probe equipment and scanning electron microscopy (SEM). From this study, it is known that, electrical properties were influenced by changes of annealing temperature. Resistivity of thin films was found to decrease as the annealing temperatures increase. Also indicate in this paper the surface morphology of the thin film.
Keywords :
annealing; electrical conductivity; electrical resistivity; scanning electron microscopy; semiconductor growth; semiconductor thin films; sol-gel processing; spin coating; surface morphology; titanium compounds; wide band gap semiconductors; IV measurement; SEM; annealing; electrical conductivity; resistivity; scanning electron microscopy; sol-gel method; spin coating; surface morphology; titanium dioxide thin film; Annealing; Coatings; Conductivity; Glass; Scanning electron microscopy; Sputtering; Substrates; Temperature; Titanium; Transistors; annealing temperature; conductivity; resistivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Devices, Systems and Applications (ICEDSA), 2010 Intl Conf on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-6629-0
Type :
conf
DOI :
10.1109/ICEDSA.2010.5503040
Filename :
5503040
Link To Document :
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