Title :
Single-event transient (SET) characterization of a LM119 voltage comparator: an approach to SET model validation using a pulsed laser
Author :
Buchner, S. ; McMorrow, D. ; Sternberg, A. ; Massengill, L. ; Pease, R.L. ; Maher, M.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Abstract :
The characteristics of single-event transients generated in a LM119 voltage comparator with a pulsed laser have been studied under a wide variety of operating conditions. Those transients can be compared with transients obtained from circuit simulator programs to validate the model parameters used by those programs.
Keywords :
SPICE; bipolar analogue integrated circuits; comparators (circuits); integrated circuit measurement; integrated circuit modelling; laser beam effects; LM119 voltage comparator; SPICE; circuit simulator programs; linear bipolar circuits; model validation; pulsed laser measurements; single-event transient characterization; Circuit simulation; Circuit testing; Ion beams; Laser modes; Optical pulse generation; Optical pulses; Pulse circuits; Pulse measurements; Semiconductor lasers; Voltage;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on
Print_ISBN :
0-7803-7313-8
DOI :
10.1109/RADECS.2001.1159318
