• DocumentCode
    2920186
  • Title

    Characterization of power transistors and low voltage logic circuits at high dose and temperature

  • Author

    Le Gac, J.-P. ; Giraud, A. ; Brichard, B. ; Brisset, C. ; Picard, C.

  • Author_Institution
    CEA Saclay, Gif sur Yvette, France
  • fYear
    2001
  • fDate
    10-14 Sept. 2001
  • Firstpage
    455
  • Lastpage
    460
  • Abstract
    Controlled thermonuclear fusion environments require electronic systems that can withstand both high radiation doses and elevated temperatures. This study investigates the response of power transistors and low voltage logic circuits to these two constraints.
  • Keywords
    logic circuits; low-power electronics; power MOSFET; radiation effects; CMOS inverter circuits; controlled thermonuclear fusion environment; high dose effects; high temperature effects; low voltage logic circuits; power MOSFETs; power transistors; Circuit testing; Electronic components; Electronic equipment testing; Fusion reactors; Inductors; Logic circuits; Low voltage; Phase measurement; Power transistors; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on
  • Print_ISBN
    0-7803-7313-8
  • Type

    conf

  • DOI
    10.1109/RADECS.2001.1159322
  • Filename
    1159322
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2920186